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Prof. Subhasish Mitra
Departments of Electrical Engineering and Computer Science, Stanford University
Email: subh at stanford dot edu
Phone: 650-724-1915
http://www.stanford.edu/~subh Professor Subhasish Mitra directs the Robust Systems Group in the Department of Electrical Engineering and the Department of Computer Science of Stanford University. His research interests include robust system design, VLSI design, CAD, validation and test, and emerging nanotechnologies. Prior to joining Stanford, Prof. Mitra was a Principal Engineer at Intel Corporation. He received Ph.D. in Electrical Engineering from Stanford University.

Prof. Mitra has co-authored more than 150 technical papers, and invented design and test techniques that have seen wide-spread proliferation in the semiconductor industry. His X-Compact technique for test compression has been used in more than 50 Intel products, and has influenced major CAD tools. The IFRA technology for post-silicon validation, created jointly with his student, was characterized as "a breakthrough" in a Research Highlight in the Communications of the ACM (CACM). His work on the first demonstration of carbon nanotube imperfection-immune VLSI circuits, jointly with his students and collaborators, was selected by the National Science Foundation (NSF) as a Research Highlight to the United States Congress, and was highlighted "as a significant breakthrough" by the Semiconductor Research Corporation (SRC), the MIT Technology Review, and several others.

Prof. Mitra's honors include the Presidential Early Career Award for Scientists and Engineers from the White House, the highest honor bestowed by the United States on early-career outstanding scientists and engineers, Terman Fellowship, IEEE CAS/CEDA Donald O. Pederson Award for the best paper published in the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ACM SIGDA Outstanding New Faculty Award, Intel Divisional Recognition Award "for a breakthrough soft error protection technology," and the Intel Achievement Award, Intel’s highest corporate honor, "for the development and deployment of a breakthrough test compression technology." He and his students presented award-winning papers at several major conferences: IEEE/ACM Design Automation Conference, IEEE VLSI Test Symposium, Symposium on VLSI Technology, IEEE International Test Conference, and the Intel Design and Test Technology Conference. At Stanford, he was honored multiple times by graduating seniors "for being important to them during their time at Stanford."

Prof. Mitra has delivered more than four dozen keynote speeches, distinguished lectures, and invited presentations at major international forums. He currently serves on the Defense Advanced Research Projects Agency (DARPA) Information Science and Technology (ISAT) Board as an invited member, and on several conference committees, advisory boards, and journal editorial boards.

Administrative Staff

Beverly Davis
Email: beverlyb at stanford dot edu
Office: Gates Building, Room 336
Phone: 650-723-1458

Affiliated Students

Graduate

PhD Graduates

Undergraduates (REUs)

  • Eric Y. Chang
  • Avinash Nayak

Former Undergraduates and High School Students (REUs)

  • Brian Lumpkins
  • Max Shulaker
  • Robert M. Beatty Jr.
  • Spencer Chu
  • Sewon Jang
  • Alfred Lloyd
  • David Wanyoike Mwaura
  • Aditya Singh
  • Kyle T. Anderson

Visitors

Visiting Professors

Visiting Researchers

  • Kyungwoo Nam, Samsung
  • Bipul C. Paul, Toshiba

Former Visiting Professors

Former Visiting Researchers

  • Hiroaki Inoue, NEC
  • Haykel Ben Jamaa, EPFL, Switzerland
  • Igor Loi, University of Bologna, Italy

Former Visiting Students

  • Christian Cruz
  • Jin Yang (Tsinghua University)

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